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Research at UC
JEOL JSM7000F Field Emission Scanning Electron Microscope
Availability
Use after training
Use by agreement
Use with fee
Fee for service only
Equipment Summary
High resolution field emission scanning electron microscope equipped with backscatter electron detector, JEOL energy dispersive X-ray analysis system
Key Contact
Mike John Flaws; Mechanical Engineering
Researchers
Milo Kral; Mechanical Engineering
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